Effects of SrAl2O4 Homo-Buffer Layer on SrAl2O4(:)Eu Phosphors Film Grown on Glass by RF Sputtering
The influence of pre-deposition of homo-buffer layers on film quality is studied for SrAl2O4(:)Eu2+ (SAO) crystalline film prepared by RF magnetron method.This preparation technique is necessary to prepare high quality films suitable for the development of SAO devices.Crystallinity and surface morphology were characterized by X-ray diffraction and scanning electron microscopy.After introducing a homo-buffer layer,not only the crystalline but also the surface morphology and adhesion of the film were obviously improved.These results imply that the buffer layer relaxes the strain due to the lattice mismatch between SAO and quartz glass,which improved the crystalline and adhesion of the film.
Homo-buffer SrAl2O4(:)Eu2+ film RF sputtering method Photoluminescence
Xiaoyan Fu Hiroshi Yamada Chaonan Xu
National Institute of Advanced Industrial Science and Technology(AIST Kyushu),Shuku807-1,Tosu,Saga 8 National Institute of Advanced Industrial Science and Technology(AIST Kyushu),Shuku807-1,Tosu,Saga 8
国际会议
The Fifth China International Conference on High-Performance Ceramics (第五届先进陶瓷国际研讨会(CICC-5))
长沙
英文
1358-1361
2007-05-10（万方平台首次上网日期，不代表论文的发表时间）