Effects of laser peak power on P3 pattern process in silicon thin film solar module fabrication
Laser patterning technique,especially the third pattern step (P3) to ablate the silicon layer and back contact,is one of the most critical processes during the monolithic series connected amorphous Silicon (a-Si) solar module fabrication.In this study,we monitored peak powers (Ppeak) of laser beam under different laser parameter conditions and investigated the effects on the quality of P3 scribing and electrical performance of larger area a-Si modules (1300 mm×1100 mm).We found that well-defined and flake-free ablation line could be obtained by using laser beam with the Ppeak just higher than a threshold value of ~1 kW.Too higher Ppeak led to large melted zone on the front contact layer and deteriorated the performance of solar modules.
R.Sun H.Wang J.Wang C.Xu L.Lu D.Wang Y.Huang H.Jia Y.Mai
Baoding Tianwei Solarfilms Co., Ltd., Baoding 071051, China
国际会议
The 22nd International Photovoltaic Science and Engineering Conference (第22届国际光伏科学与工程会议)
杭州
英文
1-5
2012-11-05（万方平台首次上网日期，不代表论文的发表时间）