System yield analysis of crystalline Si PV modules with manufacturers flash test results

摘要：

　　In this study,manufacturers flash test results,indoor STC measurement results and outdoor annual performance ratios are compared in single and multi crystalline Si PV modules.All the modules met the JIS requirement but accuracy of the flash test is not so high in some manufacturer.The systems with the higher adjusted normalized average of the flash test showed relatively higher performance ratio.

作者: Yuzuru Ueda Kosuke Kurokawa Mitsuru Kudo Hiroo Konishi

作者单位: Tokyo Institute of Technology, NE-15, 2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8552 Japan NTT FACILITIES, INC., Granparktower, 3-4-1 Shibaura, Minato-ku, Tokyo, 108-0023, Japan

会议类型: 国际会议

会议名称: The 22nd International Photovoltaic Science and Engineering Conference (第22届国际光伏科学与工程会议)

会议地点: 杭州

会议语种:英文

页码: 1-3

在线出版日期: 2012-11-05（万方平台首次上网日期，不代表论文的发表时间）