Bubble-induced Relaxation in High-pressure Microfluidic Systems

摘要：

　　This work reported an analysis of a noticeable relaxation phenomenon caused by undesirable air bubbles in high-pressure microfluidic systems.A model with compression of air bubble considered was established to address the experimental observed pressure relaxation.The results indicated that the dominative factors were flow rate,flow resistance and initial diameter of the trapped air bubble.Meanwhile,the calculated relaxation times in different cases provided a design guideline for high-pressure microfluidic chip to avoid the long-term pressure relaxation.

关键词： Microfluidic Air bubble Relaxation High-pressure

作者: Baojun Wang Fei Xie Wei Wang Wengang Wu Zhihong Li

作者单位: Institute of Microelectronics, Peking University, National Key Laboratory of Micro/ Nano Fabrication Technology, Beijing, 100871, China

会议类型: 国际会议

会议名称: 中国微米纳米技术学会第14届学术年会、第3届国际年会暨第6届微米纳米技术“创新与产业化国际研讨与展览会(CSMNT2012 & ICMAN2012)

会议地点: 杭州

会议语种:英文

页码: 1-4

在线出版日期: 2012-11-04（万方平台首次上网日期，不代表论文的发表时间）