Fast Two-Dimensional Phase Unwrapping Algorithm Based on Histogram Processing of Reliability

摘要：

　　A novel approach for two-dimensional phase unwrapping is presented.Reliability functions with fixed value range are defined for pixels and edges.Through histogram statistics for reliability values of edges,all edges are allocated to the corresponding subintervals of histogram.The proposed algorithm unwraps the phase subinterval by subinterval and for each subinterval edge by edge.A number of simulated and experimental results show that the proposed algorithm reacts satisfactorily to random noise and discontinuities in the wrapped phase distribution.The execution time of this algorithm is less than 60 ms for an image size of 800×800 pixels on a PC system generally.So this algorithm can achieve quasi-real-time performance.

关键词： phase unwrapping fringe analysis digital holography

作者: Fei Wang Ya-Nan Zeng Hai Lei Xiao-Tang Hu Xiao-Dong Hu

作者单位: State Key Laboratory of Precision Measuring Technology & Instruments, Tianjin University, Tianjin, China

会议类型: 国际会议

会议名称: 第16届机电一体化技术国际会议

会议地点: 天津

会议语种:英文

页码: 116-121

在线出版日期: 2012-10-16（万方平台首次上网日期，不代表论文的发表时间）