An Extensive IP Reliability Evaluation Platform
The reliability and robustness of Intellectual Properties (IPs) are the keys to the success of the modern System on Chip (SoC) designs.Therefore,it is very important to implement a rigid IP evaluation platform to ensure the reliability of IPs in the SoC design flow.In this paper,we introduce major aspects of IP reliability and present a XML schema based metric model which is able to describe reliability characteristics of IP cores.An evaluation platform is implemented based on the metric model.The experimental results on three open source IPs demonstrate that the evaluation platform can assess IP reliability quantitatively and locate its bottleneck.
intellectual property reliability evaluation
Li-Wei Wang Hong-Wei Luo
Science and Technology on Reliability Physics and Application of Electronic Component Laboratory CEPREI Laboratories Guangzhou, China
国际会议
成都
英文
190-194
2012-06-15（万方平台首次上网日期，不代表论文的发表时间）