会议专题

Multi-State Degradation Analysis for A Condition Monitored Device With Unobservable States

  The degradation process associated with a mechanical device can be represented by a discrete type of multi-state degradation model.Each discrete state in a multi-state degradation model corresponds to a certain health status of the device.In this paper,a general type of multi-state degradation model is considered for a device for which the health states are not directly observable and instead,indirect information is available through condition monitoring.We first demonstrate how nonhomogeneous continuous-time hidden semi-Markov process can be used to model a multi-state degradation process and then briefly review an unsupervised estimation procedure,which can be used to estimate the unknown characteristics of the stochastic processes associated with the degradation process and the observation process of a multi-state device.A simple numerical example is provided to demonstrate the application of the presented model.

multi-state degradation unsupervised estimation Condition Monitoring semi-Markov process

Ramin Moghaddass Ming J. Zuo

Reliability Research Lab Department of Mechanical Engineering University of Alberta, Edmonton, Canad Reliability Research Lab Department of Mechanical Engineering University of Alberta, Edmonton, Canad

国际会议

2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering & The 3rd International Conference on Maintenance Engineering (2012质量,可靠性,风险,维修性及安全性工程国际会议(QR2MSE 2012 & ICME 2012))

成都

英文

547-552

2012-06-15(万方平台首次上网日期,不代表论文的发表时间)