The Implementing Complicated Digital Bus Device Test Using General Purpose Digital Instrument

摘要：

　　For the complicated digital bus device testing,there are two approaches: dedicated bus instrument and generalpurpose digital IO instrument.The dedicated bus testers providing the more advanced capability including exercising the bus,injecting errors,fully characterizing specification compliance for design validating and verification phase.This paper presents a modular solution based on the general-purpose digital IO instrument.By using built-in architectural elements such as the deep onboard memory,hardware handshaking,and an algorithmic engine,test engineers can increase the performance,modularity and simplification of test system.

关键词： digital I/O instrument bus interface DTIF

作者: Qu Wei Zhu Ning

作者单位: R&D Department Jiangsu Automation Research Institute of CSIC Lianyungang, China Command and Management Department Mechanical Engineering College Shijiazhuang, China

会议类型: 国际会议

会议名称: 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering & The 3rd International Conference on Maintenance Engineering (2012质量,可靠性,风险,维修性及安全性工程国际会议(QR2MSE 2012 & ICME 2012))

会议地点: 成都

会议语种:英文

页码: 884-887

在线出版日期: 2012-06-15（万方平台首次上网日期，不代表论文的发表时间）