Aging Data Analysis Methods Based on Short-Term Aging Test

摘要：

　　Lifetime is a key parameter for electronic products using,and how to obtain the lifetime by using a short-term aging data has become an international issue.In this paper,a new aging data analysis method will be introduced,and three groups of aging data for high power laser diodes will be as a case to expound this method.The aging test time will be greatly decreased by using this method.

关键词： lifetime aging test laser diode thermal activation energy acceleration factor

作者: Guoguang Lu Yun Huang Yunfei En

作者单位: Science and Technology on Reliability Physics and Application of Electronic Component Laboratory China Electronic Product Reliability and Environmental Testing Research Institute Guang Zhou, P.R.China

会议类型: 国际会议

会议名称: 2012 International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering & The 3rd International Conference on Maintenance Engineering (2012质量,可靠性,风险,维修性及安全性工程国际会议(QR2MSE 2012 & ICME 2012))

会议地点: 成都

会议语种:英文

页码: 904-907

在线出版日期: 2012-06-15（万方平台首次上网日期，不代表论文的发表时间）