Analysis simulation of facet temperature in semiconductor lasers
This paper analyzes the damage mechanism of the semiconductor laser cavity surface. Catastrophic optical damage (COD) is one of major mechanisms, which drastically limits laser lifetime and emitted optical power. This paper builds the theoretical model that based on heat source with injection current and optical power to describe the temperature distribution of laser. Through analyzing the edge-emitting semiconductor lasers by using ANSYS, we can describe change of facet temperature distribution before and after the COD events. Through the results of simulation, we can get the conclusion that the main reason of COD is oxidation of the semiconductor laser in facet which caused by optical absorption.
catastrophic optical damage facet temperature simulatiom of finite element ANSYS
Xiaogang Zheng Zaijin Li Te Li Peng Lu Yong Wang Yonggang Zou Yi Qu
Baoxue Bo, Guojun Liu, Xiaohui Ma National Key Lab on High Power Semiconductor Lasers Changchun University of Science and Technology Changchun , China
国际会议
2012 International Conference on Optoelectronics and Microelectronics(2012光电子与微电子国际学术会议 2012 ICOM)
长春
英文
111-114
2012-08-23（万方平台首次上网日期，不代表论文的发表时间）