Automated Nanomanipulation with AFM by Using L1 Adaptive Controller

摘要：

In this paper, a novel control methodology for automatically manipulating nano particles by using Atomic Force Microscope (AFM) is presented. First of all, a mathematical model of nanomanipulation including the interactive forces and dynamics between the tip, particle and substrate along with the roughness effect of the substrate is introduced. Further, in order to deal with the nonlinear uncertain system, a stable virtual reference counterpart is constructed. Thereafter, a piece-wise continuous adaptive law is introduced along with a low-pass filter to obtain arbitrarily close tracking of the output, while the bounded transient performance of the input signal is also guaranteed. Rigid mathematical proof is substantiated by simulation results.

关键词： Nanomanipulatoin L1 Adaptive Control AFM

作者: YANG Qinmin LUO Jie CAO Chengyu LU Jiangang SUN Youxian

作者单位: State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering Department of Mechanical Engineering, University of Connecticut, Storrs CT 06269, USA State Key Laboratory of Industrial Control Technology, Department of Control Science and Engineering

会议类型: 国际会议

会议名称: The 31st Chinese Control Conference(第三十一届中国控制会议)

会议地点: 合肥

会议语种:英文

页码: 3081-3086

在线出版日期: 2012-07-01（万方平台首次上网日期，不代表论文的发表时间）