A suppressed mismatch of charge pump and single-event-hardened PLL

摘要：

This paper presents a new structure phase-locked loop (PLL), which eliminates fluctuations on the control voltage of VCO resulting from the mismatch of charge pump (luring locked state, at the same time, the proposed PLL adopts a new idea to enhancement PLLs immunity to single event effects when used in aerospace environment. Simulations show that compared with conventional structure, the proposed PLL achieves l0dBc/Hz phase noise improvement, while the recovery time and the voltage fluctuation resulted from a single event decreased about 84.3％ and 87.6％ respectively.

关键词： phase-locked loop single event effect phase noise radiation hardened by design current mismatch

作者: Benguang Han Longsheng Wu Youbao Liu

作者单位: Xian Microelectronic Technology Institute, Xian 710054, China

会议类型: 国际会议

会议名称: 2012 International Conference on Electric Technology and Civil Engineering(2012 电子技术与土木工程国际会议 ICETCE 2012)

会议地点: 三峡

会议语种:英文

页码: 9-12

在线出版日期: 2012-05-18（万方平台首次上网日期，不代表论文的发表时间）