Surface Roughness Measuring Instrument Based on MSP430

摘要：

Surface roughness measuring instrument based on MSP430 is designed. This instrument uses MSP430F149 MCU as lower computer to acquire data from LVD T sensor by using 12-bit A/D module in MCU, then the data are transmitted to upper computer through USB interface chip PDIUSBD12. The upper computer takes Lab VIEW as software development platform, utilizes the powerful data processing capability of LabVIEW for real-time processing , analysis and display of acquired data and realizes automatic measurement of surface roughness. Compared with similar products, this instrument has many advantages such as simple circuit , low cost , high speed and portability, etc.

关键词： surface roughness MSP430F149 LabVIEW

作者: Fengguo Jiang Yantao Wang

作者单位: School of Electromechanical Automobile Engineering, Yantai University Key Laboratory of Advanced Manufacturing and Control Technology in Universities of Shandong Yantai, China

会议类型: 国际会议

会议名称: 2012 International Conference on Electric Technology and Civil Engineering(2012 电子技术与土木工程国际会议 ICETCE 2012)

会议地点: 三峡

会议语种:英文

页码: 1905-1908

在线出版日期: 2012-05-18（万方平台首次上网日期，不代表论文的发表时间）