Analysis and Improvement of Effect Caused by Flange and Absorber

摘要：

Based on large measurement data and modern numerical simulation technique, effects caused by flange and absorber on far-field characteristics of Open Ended Waveguide (OEWG) probes are investigated. By comparing simulations and measurements, variation and ripple-amplitude of far-field gain and pattern caused by absorber effect in C band, X-band and Ku-band are analyzed. According to the analysis, possible improvements to suppress the effect are proposed; keeping consistency of absorber configuration both among measurement and calibration is strongly recommended.

关键词： Open Ended Waveguid absorber flange calibration numerical simulation gain pattern

作者: Weilong Wang Zhifei Wang Fan Wu

作者单位: National Institute of Metrology, Beijing, China Beijing The Peoples Republic of China Army Aviation Institute of PLA,Beijing, The Peoples Republic of China National Institute of Metrology, Beijing, China Beijing, The Peoples Republic of China

会议类型: 国际会议

会议名称: 2012 International Conference on Electric Technology and Civil Engineering(2012 电子技术与土木工程国际会议 ICETCE 2012)

会议地点: 三峡

会议语种:英文

页码: 2146-2149

在线出版日期: 2012-05-18（万方平台首次上网日期，不代表论文的发表时间）