Digital Transformation of Motor Turn-to-Turn Insulation Tester

摘要：

Turn-to-turn insulation testers have been widely used in motor industry, in order to make up for the shortage of traditional analog turn-to-turn insulation testers and improve intelligence level of test, digital transformation is taken for turn-toturn insulation testers. The design uses MSP430F149 MCU as the main control chip, AD7663 as high-speed sampling chip, PDIUSBD12 as USB interface chip achieving communication between MSP430F149 MCU and upper computer, corresponding software is programmed in IAR Embedded Workbench and LabVIEW. Through digital transformation of the exiting tester, satisfactory effect is obtained.

关键词： turn-to-turn insulation digital transformation MSP430F149 PDIUSBD12 LabVIEW

作者: Fengguo Jiang Peng Liu

作者单位: School of Electromechanical Automobile Engineering, Yantai University;Key Laboratory of Advanced Manufacturing and Control Technology in Universities of Shandong Yantai, China

会议类型: 国际会议

会议名称: 2012 International Conference on Electric Technology and Civil Engineering(2012 电子技术与土木工程国际会议 ICETCE 2012)

会议地点: 三峡

会议语种:英文

页码: 2295-2298

在线出版日期: 2012-05-18（万方平台首次上网日期，不代表论文的发表时间）