An Exponential Decay Model for the Estimation of Phalaenopsis Leaf Moisture Percentage (LMP) using the Spectral Signature at 1450 nm
Plant spectral signature is unique characteristic in comparison with that of other materials. The absorption and reflectance features of plant leaves mainly depend on their chemical components such as chlorophyll, water, lignin, and cellulose etcetera. The variation of component level will cause changes of foliar spectral signatures. Leaf water content or moisture percentage (LMP) is a major factor influencing foliar spectral signatures. This paper develops an empirical model for monitoring LMP of Phalaenopsis leaves. An ASD spectroradiometer was used to collect foliar reflectance and only the reflectance at 1450 nm, the central wavelength of water absorption region in shortwave infrared. Based on analysis of variance accompanied with t-test of model parameters and the variance of inflation factor, an exponential decay model was validated to be suitable for Phalaenopsis foliar LMP estimation. The Coefficient of determination of this model is 0.98.
Phalaenopsis orchid spectral signature leaf moisture percentage remote sensing
Chinsu Lin Kanokphon Techati
Dept. of Forestry and Natural Resources National Chiayi University Chiayi, Taiwan
国际会议
三峡
英文
2959-2962
2012-05-18（万方平台首次上网日期，不代表论文的发表时间）