Research on Scan Chain Configuration in JTAG Test
this paper reviews the three basic boundary-scan chain configuration and characteristic covered in IEEE 1149.1 Standard, and points out some problems that these configurations faced with, then one design of board level dynamic BS chain is proposed with good flexibility for DFT. Some feasible suggestions and attentions about boundary-scan chain configuration are also available in the project.
JTAG Boundary-scan Chain configuration Chain connection
Gang Du Xiaojie Li
Dept of International Education, Dept of Electronic Information Zhengzhou Electric Power College Zhengzhou, China
国际会议
三峡
英文
3420-3423
2012-05-18(万方平台首次上网日期,不代表论文的发表时间)