会议专题

Research on Scan Chain Configuration in JTAG Test

this paper reviews the three basic boundary-scan chain configuration and characteristic covered in IEEE 1149.1 Standard, and points out some problems that these configurations faced with, then one design of board level dynamic BS chain is proposed with good flexibility for DFT. Some feasible suggestions and attentions about boundary-scan chain configuration are also available in the project.

JTAG Boundary-scan Chain configuration Chain connection

Gang Du Xiaojie Li

Dept of International Education, Dept of Electronic Information Zhengzhou Electric Power College Zhengzhou, China

国际会议

2012 International Conference on Electric Technology and Civil Engineering(2012 电子技术与土木工程国际会议 ICETCE 2012)

三峡

英文

3420-3423

2012-05-18(万方平台首次上网日期,不代表论文的发表时间)