Research on Scan Chain Configuration in JTAG Test

摘要：

this paper reviews the three basic boundary-scan chain configuration and characteristic covered in IEEE 1149.1 Standard, and points out some problems that these configurations faced with, then one design of board level dynamic BS chain is proposed with good flexibility for DFT. Some feasible suggestions and attentions about boundary-scan chain configuration are also available in the project.

关键词： JTAG Boundary-scan Chain configuration Chain connection

作者: Gang Du Xiaojie Li

作者单位: Dept of International Education, Dept of Electronic Information Zhengzhou Electric Power College Zhengzhou, China

会议类型: 国际会议

会议名称: 2012 International Conference on Electric Technology and Civil Engineering(2012 电子技术与土木工程国际会议 ICETCE 2012)

会议地点: 三峡

会议语种:英文

页码: 3420-3423

在线出版日期: 2012-05-18（万方平台首次上网日期，不代表论文的发表时间）