Studies on the Electromagnetic Compatibility of Integrated Circuit

摘要：

This paper describes the importance and the key concepts of the Electromagnetic Compatibility (EMC) at Integrated Circuits(ICs) level, studies on the Electromagnetic Compatibility of ICs, provides some useful technologies for IC design, and also introduces basic measurement methods based on EMC standards.

关键词： ICs EMC design measurement methods

作者: Yuanyuan Wang

作者单位: College of electrical and control engineering Xian University of Science and Technology Xian, China

会议类型: 国际会议

会议名称: 2012 International Conference on Electric Technology and Civil Engineering(2012 电子技术与土木工程国际会议 ICETCE 2012)

会议地点: 三峡

会议语种:英文

页码: 3503-3505

在线出版日期: 2012-05-18（万方平台首次上网日期，不代表论文的发表时间）