Storage Test Techniques and Wireless Transmission based on Embedded System

摘要：

Memory test technology is the most effective means to record the parameters of moving objects under special circumstances. This paper introduced the development of storage test systems based on ARM7LPC21XX. PHILIPS chip 16/32-bit microcontroller -LPC21XX was a 16/32-bit ARM7 TDMI-S CPU microcontroller based on a real-time emulation and embedded trace. It had two powers -saving modespower down and idles, which could ensure the battery to work for a long time. The microcontroller internal 10-bit AD was used to sample data as well as SPI and NRF24L01 modules to realize communication.

关键词： embedded system ARM7 SPI NRF24L01 low power consumption

作者: Wu hong Han tao Wang can

作者单位: School of Electronic Engineering,Heilongjiang University, Harbin, 150080, China School of Electronic Engineering, Heilongjiang University, Harbin, 150080, China

会议类型: 国际会议

会议名称: 4th International Conference on Measuring Technology and Mechatronics Automation(第四届检测技术与机电自动化国际会议 ICMTMA 2012)

会议地点: 三亚

会议语种:英文

页码: 1020-1024

在线出版日期: 2012-01-06（万方平台首次上网日期，不代表论文的发表时间）