Microstructure and Optical Properties of ZnO.Cu Films
Pure and Cu-doped zinc oxide (ZnO:Cu) films were deposited on glass substrates using radio frequency (RF) reactive magnetron sputtering. The effect of Cu concentrations on the microstructure and the luminescence properties of the ZnO:Cu thin films were studied by X-ray diffraction (XRD),scanning electron microscopy (SEM) and fluorescence spectrophotometer. The results indicated that ZnO films showed a stronger preferred orientation toward the c-axis at appropriate Cu concentrations;the photoluminescence spectra (PL) of the samples were measured at room temperature. Two strong blue peaks located at 447 nm (2.77 eV) and 486 nm (2.55 eV) and a weak green peak located at 527 nm (2.35 eV) were observed from the PL spectra of the samples. The origin of these emissions was discussed.
ZnO:Cu thin films RF magnetron sputtering Optical properties
Ligang Ma Shuyi Ma Yingfeng Li Haixia Chen Xiaoqian Ai
College of Physics and Electronic Engineering,Northwest Normal University,Lanzhou,Gansu 730070,China Department of Electrical and Computer Engineering,Texas A&M University,College Station,Texas 77843,U School of Science,Xian Shiyou University,Xian,Shaanxi 710065,China
国际会议
西安
英文
254-257
2011-12-23（万方平台首次上网日期，不代表论文的发表时间）