Automatic Testing System for EMC Testing with Wavelet Analysis Application Based on LabVIEW

摘要：

According to the problem that the speed of electromagnetic compatibility(EMC) manual system is slow,a automatic testing system is designed for power supply line conducted emission based on generalpurpose interface bus(GPIB) and LabVIEW,which actualizes a series of functions,such as signal generating,monitoring,analyzing and showing. It introduces the constituting of system,testing principle,software structure,and solves the hard problems and key techniques such as hardwares controlling,algorithms fast convergence,compatibility of software. Because the testing signal include the ambient noise,the wavelet analysis is applied to filter the noise and gain the real conducted electromagnetic interference. Comparing with the other traditional apparatuses and the manual testing,the system improves the test efficiency and has good extensibility.

关键词： Electromagnetic Interference LabVIEW Automatic Testing System Wavelet Analysis

作者: Lanyong Zhang Sheng Liu Bing Li

作者单位: College of Automation,Harbin Engineering University,150001 China

会议类型: 国际会议

会议名称: 2011 International Conference on Opto-Electronics Engineering and Information Science(2011光电电子工程与信息科学国际会议 ICOEIS 2011)

会议地点: 西安

会议语种:英文

页码: 1534-1537

在线出版日期: 2011-12-23（万方平台首次上网日期，不代表论文的发表时间）