TEM Response of a Large Loop Source over a Halfspace and a Layered Halfspace

摘要：

The all-time and late-time response of TEM over a homogeneous halfspace and layered halfspace are described. We analyzed the theoretical results and gave the differences between all-time resistivity and late-time resistivity. By using the program EMMA,the effects of three different mouels on iEM measurements are fui ther discussed. Finally the advantages and disadvantages of three different models were obtained.

关键词： TEM Transient Response Layered Halfspace Late-time apparent resistivity

作者: Yu Qun He Sheng Zhang Shuang

作者单位: College of Electronic Science and Engineering Jilin University,Changchun,China

会议类型: 国际会议

会议名称: 2011 International Conference on Opto-Electronics Engineering and Information Science(2011光电电子工程与信息科学国际会议 ICOEIS 2011)

会议地点: 西安

会议语种:英文

页码: 1658-1662

在线出版日期: 2011-12-23（万方平台首次上网日期，不代表论文的发表时间）