会议专题

Observation on the Attachment Processes of Competition Tests under Switching Impulse Voltage

The attachment processes of competition tests under switching impulse voltage were studied in this paper.A series of competition tests with rod-rod gap configuration for these studies were carried out.In these competition tests, a high-speed CCD video camera was used to clarify the attachment processes, assisting by current measurement of the grounded rods and the voltage measurement of the discharge gap.The experimental results indicated that the processes can be divided into two stages related to the downward discharge and the upward discharge respectively, both in positive and negative competition tests.However, the scale of the two stages and the discharge process in the two stages are different, and these differences affect the striking probability finally.

attachment process competition test lightning switching impulse striking probability

Shijun Xie Hengxin He Junjia He Weijiang Chen Jiahong Chen Shanqiang Gu Nianwen Xiang

State Key Laboratory of AdvancedElectromagnetic Engineering andTechnologyHuazhong University of Scie State Grid Corporation of ChinaBeijing,China State Grid Electric Power ResearchInstituteWuhan,China State Grid Electric Power Research Institute Wuhan,China

国际会议

第七届亚太防雷国际会议

成都

英文

1-4

2011-11-01(万方平台首次上网日期,不代表论文的发表时间)