Study on Automatioc Test Generation of Digital Circuits Using Particle Swarm Optimazation
The development of digital integrated circuit has put forward urgent demands for test technology. Test technology has become a bottleneck in the application of LSI/VLSI. Especially for sequential circuits, it is still a problem which is not resolved completely in theory. By making use of the structure information of circuits, a method of automatic test generation for sequential circuits based on Particle swarm optimization is presented, which is performed by two steps, initialization and fault detection. Experimental results show that the approach can achieve high fault coverage, and CPU times needed for test generations are very short, which shows that it is a method deserving research.
Automatic Test Generation Sequential Circuits Particle Swarm Algorithm
Gu Yuan-liang Xu Wen-bo
IoT Engineering Jiangnan University Wuxi, Jiangsu, China
国际会议
无锡
英文
324-328
2011-10-14（万方平台首次上网日期，不代表论文的发表时间）