Damage Efficiency Research of PCB Components under Strong Electromagnetic Pulse
To study damage effectiveness of strong electro-magnetic pulse to components of equipments, the power density in area of MOS circuit, diodes and transistor of a computer is simulated, using the method of the finite-difference time-domain (FDTD). Coupling laws in different areas are achieved, and then judging the damage efficiency of components. Electromagnetic pulse reflects constantly in computer box, causing power density appears oscillations. Energy gradually declines to zero, for it radiates outward from slots. Field concentration around PCB board results in dissociation of field strength, and slows down the attenuation of energy. Finally, formula of power density at random field strength and rise time is also obtained.
FDTD Strong electromagnetic pulse Computer box Couplings Damageeffectiveness
Xie Fei Cao Bing Liu Chenglong
School of Mechanical Engineering, Nanjing University of Science and Technology, Nanjing, China
国际会议
合肥
英文
1383-1386
2011-09-23（万方平台首次上网日期，不代表论文的发表时间）