Inspection of Fabric Defects Based on Compactly Supported Biorthogonal Wavelet Transform
A method to inspect fabric defects based on compactly supported biorthogonal wavelet transform is presented. Firstly, the fabric images are captured by CCD camera. Then fabric defects are detected by means of the strategy of compactly supported biorthogonal wavelet transform. The phase shifts with the orthogonal and the biorthogonal wavelet techniques are compared aiming at the warp-lacking. It is shown that the phase shifts of orthogonal wavelet behave as different degrees, the ones of biorthogonal wavelet are zero. Finally, employing the biorthogonal wavelet method to inspect fabric defects, including warplacking, weft-lacking, oil stains, and holes, is given by experiments, in which the results are satisfied.
fabric defects biorthogonal wavelet compactly supported
Chen Shuyue Xu Mingqian
School of Information Science and Engineering, Changzhou University, China, 213164
国际会议
合肥
英文
2111-2114
2011-09-23（万方平台首次上网日期，不代表论文的发表时间）