BISS: A Built-in SEU Sensor For Soft Error Mitigation

摘要：

This paper presents a built-in SEU sensor (BISS) to detect soft errors in CMOS digital systems. BISS detects SEU-induced soft errors by monitoring the meta-stability in the flip-flops. BISS includes positive pulse generator, footed dynamic inverter and keeper. SPICE simulations validate the approach. Experiments show minor overhead in terms of area. BISS can yield 80％ error coverage at the cost of 22％ area overhead. As its prominent advantage, insertion of BISS will incur minimal performance degradation.

关键词： Built-in SEU Sensor Soft Errors Single Event Upset Meta-stability

作者: Zhengfeng Huang Maoxiang Yi

作者单位: School of Electronic Science and Applied Physics.Hefei University of Technology,Hefei, 230009,China

会议类型: 国际会议

会议名称: 2011 3nd International Conference on Mechanical and Electronics Engineering(2011年第三届机械与电子工程国际会议 ICMEE2011)

会议地点: 合肥

会议语种:英文

页码: 4228-4231

在线出版日期: 2011-09-23（万方平台首次上网日期，不代表论文的发表时间）