Study and Analysis a Powerful Debug Method for Smart Mobile Systems

摘要：

When dealing with such complex systems such as the software package of a smart mobile phone, it is necessary to apply powerful methods to detect and report errors when they occur. This paper probes and analyzes a powerful debug method called trap and exception handling, which is supported by the ARM platforms. The method can easily capture some valuable debug information. When a fatal error occurs during runtime or system detects an abnormal, a trap or an exception shall be logged and stored in the non-volatile random access memory (NVRAM). The information must be enough and easy for engineer to analyze the software error.

关键词： smart mobile system debug ARM software

作者: Jian-guo Yuan Sheng Gu

作者单位: Key Lab of Optical Fiber Communications Technology, Chongqing University of Posts and Telecommunications, Chongqing 400065, China

会议类型: 国际会议

会议名称: 2011 3nd International Conference on Mechanical and Electronics Engineering(2011年第三届机械与电子工程国际会议 ICMEE2011)

会议地点: 合肥

会议语种:英文

页码: 4270-4273

在线出版日期: 2011-09-23（万方平台首次上网日期，不代表论文的发表时间）