Gold Thin Film as Transition Layer in Electrode Design of Na2O.PbO-Nb2O5-SiO2 Glass-ceramic Capacitors
The electrical properties and microstructure of Na2O.PbO.Nb2O5.SiO2 glass-ceramic capacitors with pre-sputtered gold film as the transition layer in electrode design were investigated. SEM observation and EDS analysis showed that the presence of gold transition layer would eliminate enormously the Ag diffusion into the dielectric layer, resulting in a smooth and dense interface contact with less porous defects near the electrode/dielectric layer region. The electrical property results indicated that the leakage current and dielectric loss had decreased by about an order of magnitude and 20％, respectively. These results were explained by the weakened diffusion of silver into dielectric layer due to the presence of gold transition layer in between the silver paste/dielectric interface.
transition layer gold thin film electrode structure glass-ceramic capacitor
Jun Zhu Jun Luo Qingmeng Zhang Qun Tang Jun Du
Advanced Electronic Materials Institute, General Research Institute for Nonferrous Metals,Beijing 10 Advanced Electronic Materials Institute, General Research Institute for Nonferrous Metals, Beijing 1
国际会议
11th IUMRS International Conference in Asia(第十一届国际材联亚洲材料大会 IUMRS-ICA 2010)
青岛
英文
457-462
2010-09-25（万方平台首次上网日期，不代表论文的发表时间）