Application of High Temperature Quantitative X-Ray Powder Diffraction on determination of ternary system

摘要：

This paper has put forward a high-temperature quantitative X-ray powder diffraction analysis method for the determination of an isothermal section of a ternary system in comparison with a conventional method. In a three-phase region of the isothermal section at 1150℃ of Cu2O(CuO)-Al2O3-SiO2 pseudo-ternary system, the compositions of the solid phase points of three system points are determined according to the quantitative analysis of the crystalline phases in the samples carried out by Rietveld method. Then the liquid phase point of the three-phase region is determined according to the crosspoints of the tie lines of every pair of system point and solid phase point. The precisions of the analytical results have reached to be 0.1 ~ 5.0 ％. By comparison, a good result is obtained for the determination of the liquid phase point of the three-phase region in the isothermal section at 1150℃ when the analytical results of high-temperature RQA analysis are used in determination of the isothermal section of the pseudo-ternary system.

关键词： Quantitative analysis High temperature X-ray diffraction Rietveld method Isothermal section

作者: Qiuguo Xiao Gangcheng Ding Peng Long Shaohua Shen

作者单位: School of Chemistry and Chemical Engineering,Hunan University of Science and Technology, Xiangtan, C School of Chemistry and Chemical Engineering, Hunan University of Science and Technology, Xiangtan,

会议类型: 国际会议

会议名称: 11th IUMRS International Conference in Asia(第十一届国际材联亚洲材料大会 IUMRS-ICA 2010)

会议地点: 青岛

会议语种:英文

页码: 355-360

在线出版日期: 2010-09-25（万方平台首次上网日期，不代表论文的发表时间）