Research on VLSI Test Compression

摘要：

This paper explores the recent classic VLSI test compression methods, analyses the characteristics of each methods, make compression among them, the advantages and disadvantages of each proposed approaches are expounded. The main purpose for test compression is to reduce test application time, hardware overhead and test cost. The test compression solutions are mainly based on scan chain, and the Xfilling methods are adopted for test compression. Finally this paper outlooks the prospective of VLSI test compression.

关键词： VLSI test compression scan chain test application time

作者: Jingbo Shao Jinfeng Ding Yuyan Huang

作者单位: College of Computer Science and Information Engineering Harbin Normal University Harbin, China

会议类型: 国际会议

会议名称: 2011 International Conference on Computer Science and Network Technology(2011计算机科学与网络技术国际会议 ICCSNT 2011)

会议地点: 哈尔滨

会议语种:英文

页码: 545-548

在线出版日期: 2011-12-24（万方平台首次上网日期，不代表论文的发表时间）