Research on SoC Test Compression
This paper explores SoC test Compression methods, compares the advantages and disadvantages of each method, generalizes the characteristics of every approach, expounds how each method works. The situation suitable for using a specific compression method is given. And the possible prospective is pointed out
test compression tests stimuli test response
Jingbo Shao Jinfeng Ding Yuyan Huang Wei Zhang
College of computer science and information engineering Harbin Normal University Harbin, China
国际会议
哈尔滨
英文
549-552
2011-12-24(万方平台首次上网日期,不代表论文的发表时间)