Application of Multi-signal Modeling Theory to Testability Analysis for Complex Electronic System
It is important to consider the testability problem for electronic equipment design dne to the increased complication of system function and structure. Multisignal model is akin to overlaying a set of singlesignal dependency models on the structural model, which combines advantages of structure model and dependency model. Thus multi-signal modeling method is adopted to describe dependency relationship and calculate testability parameters in this paper. The testability analysis process is illustrated by a practical example of centralized engine room control system. The experimental results indicate that the multi-signal modeling based method is simple, visual and effective for testability analysis of complex electronic system.
multi-signal model testability analysis complex electronic system
Haisong Liu Jiechang Wu Guojun Chen
Department of Mechanical Engineering Naval University of Engineering Wuhan, China
国际会议
哈尔滨
英文
755-758
2011-12-24（万方平台首次上网日期，不代表论文的发表时间）