DEFECT RATE ANALYSIS & REDUCTION OF MPSOC THROUGH RUN-TIME RECONFIGURABLE COMPUTING WITH MULTIPLE CACHES
The blind increase in the CMOS scaling technology has brought us to a stage where it has reached its saturation point.In here, after laying the basis of this work by having a look at the technology trend, a rising problem is addressed that is faced in manufacturing an MPSOC.Than the discussion is switched at reconfigurable computing architecture and it is extended till run-time reconfigurable computing to lead us to the point that how this scheme can reduces the defect rate problem of MPSOC manufactures.Furthermore, the work concludes at proposing a run time reconfiguring technology for MPSOCs as a replacement technology to reduce defect rates and enhance reliability through fault tolerance.The point emphasized than is that why not the leading market vendors switch towards this technology instead of suffering from all the high defect rates in their fabrication.This paper is not only a research review and proposal of new technology but also another step in the efforts for laying basis of reconfigurable computing as a future of computing technologies in context with problem which modern technology is facing today.
ENGR.ANEES UL HUSNAIN ENGR.QAISER IJAZ
Department of Computer Systems Engineering The Islamia University of Bahawalpur,Pakistan Department of Computer Systems EngineeringThe Islamia University of Bahawalpur,Pakistan
国际会议
成都
英文
413-418
2011-11-25（万方平台首次上网日期，不代表论文的发表时间）