ANALYZING THERMAL AND FLICKER NOISE FAULT-TOLERANCE CAPABILITY OF MARKOV RANDOM FIELD DIGITAL CIRCUITS

摘要：

Markov Random Field (MRF) is known to be a faulttolerance design technique that transforms simple CMOS to MRF-CMOS digital circuits.The transformed circuits are thus extremely noise-tolerant i.e.in presence of extreme noise interference; the output current levels have un-noticeable distortion. Although this technique has proved to be a solution for thermal noise only; we have extended the noisetolerance capability of MRF circuits for flicker noise in this paper.The integration of thermal and flicker noise generates complex and time-consuming simulations that have been performed on CadenceVirtuoso simulation software.Results show that the MRF design is elegant enough to cater both kinds of noise.

关键词： Markov Random Field Thermal noise Flicker noise

作者: JAHANZEB ANWER U.RAFIQUE AHMAD FAYYAZ S.ASLAM USMAN KHALID N.H.HAMID

作者单位: COMSATS Institute of Information Technology Lahore,Pakistan Universiti Teknologi PETRONAS,Malaysia

会议类型: 国际会议

会议名称: 2011 3rd International Conference on Computer Technology and Development(2011第三届计算机技术与发展国际会议 ICCTD2011)

会议地点: 成都

会议语种:英文

页码: 1012-1016

在线出版日期: 2011-11-25（万方平台首次上网日期，不代表论文的发表时间）