COMPARING FAULT-TOLERANT ARCHITECTURE FOR AUTOMOTIVE SAFETY APPLICATIONS IN LIGHT OF IEC 61508

摘要：

Fault-tolerant microcontroller units (MCU) are becoming a standard requirement in the automotive industry.In this paper, we research three faulttolerant architectures for automotive applications. Then a fully study and comparison in reliability has been applied to these different architectures through markov modeling.The analysis shows that the enhanced dual-CPU architecture outperforms higher reliability which reduces the risk 6.3 times better than the dual-CPU lock-step architecture at most, 2.7 times better than the triple module redundancy architecture.

关键词： Fault-tolerant IEC 61508 Automotive Markov model Reliability

作者: WEI ZHANG YUZHUO FU TING LIU YINZHU LIU

作者单位: School of Microelectronic in Shanghai Jiaotong University,China

会议类型: 国际会议

会议名称: 2011 3rd International Conference on Computer Technology and Development(2011第三届计算机技术与发展国际会议 ICCTD2011)

会议地点: 成都

会议语种:英文

页码: 1614-1618

在线出版日期: 2011-11-25（万方平台首次上网日期，不代表论文的发表时间）