The Investigation on the Lifetime Prediction Model of IGBT Module

摘要：

The theory and method of the accelerated lifetime test is discussed, and the failure mechanism of the IGBT module is analyzed in detail.The more integrative test data is obtained by expanding the temperature range of the accelerated lifetime test. On the basis of considering the current i and the maximal junction temperature Tj max , an improved lifetime prediction model is obtained through fitting the data of the test.The improved model is more accurate than the existent ones by the analysis and contrast of the test data errors.

关键词： accelerated lifetime test failure mechanism lifetime prediction model

作者: Binli Liu Dezhi Liu Yong Tang Ming Chen

作者单位: National Key Laboratory for Vessel Integrated Power System Technology,Naval University of Engineering,Wuhan 430033,China

会议类型: 国际会议

会议名称: 2011 IEEE International Conference on Smart Grid and Clean Energy Technologies(2011 IEEE智能电网与清洁能源技术国际会议 ICSGCE2011)

会议地点: 成都

会议语种:英文

页码: 242-246

在线出版日期: 2011-09-27（万方平台首次上网日期，不代表论文的发表时间）