Development of Test Platform for High-Voltage Storage Capacitor

摘要：

The test platform is designed and developed for qualification test and pressure test of high-voltage storage capacitor. By setting the parameter in this test platform, the test of each kind of Capacitor will be completed in different condition, such as different volts, different frequency and different of discharge current。

关键词： High-Voltage Storage Capacitor Test Platform Instrument Shunt FPGA

作者: Xuefeng Dong Xiaoliang Li Juqin Zhang Xianding Wu

作者单位: Huanghe S&T University Zhengzhou, China

会议类型: 国际会议

会议名称: The 13th IEEE Joint International Computer Science and Information Technology Conference(2011年第13届IEEE联合国际计算机科学与信息技术会议 JICSIT 2011)

会议地点: 重庆

会议语种:英文

页码: 1357-1359

在线出版日期: 2011-08-20（万方平台首次上网日期，不代表论文的发表时间）