Failure on Multilayered Anisotropic Conductive Films (ACF) Packaging
This paper develops a computational model for predicting the failure probability of multilayered packages fabricated using anisotropic conductive film (ACF).The ACF and NCA are stacked layers by layers, and spaced with each other.The analyzed pads array 10×10 combined with specified geometry parameters in the IC/ Substrate are used to analyze the failure probability.The computational results indicate that the multilayered analysis developed in this study can provide lower failure probability by means of reducing bridging effects for improving the ACF packaging yield.
anisotropic conductive film (ACF) non-conductive adhesive (NCA) multilayer V-shaped curve failure probability
Chao-Ming Lin Tzu-Chao Lin Li-Ming Chu
Graduate School of Opto-Mechatronics & Materials,WuFeng University,Taiwan,R.O.C. Department of Computer Science & Information Technology,WuFeng niversity,Taiwan,R.O.C. Department of Mechanical and Automation Engineering,I-Shou University,Taiwan,R.O.C.
国际会议
厦门
英文
68-72
2011-07-08(万方平台首次上网日期,不代表论文的发表时间)