Thermal Stability and Grain Growth Behavior of Ultrafine Grained Commercially pure Titanium Fabricated by Equal Channel Angular Pressing
Ultrafine grained commercially pure titanium (grade 2) with an average grain size of 0. 4 micron was obtained by applying a large plastic deformation through 8 successive passes of equal channel angular pressing (ECAP) at 450℃. Electron backscattered diffraction (EBSD) technique was used to study the microstructure evolution of the deformed material during isothermal annealing at a range of temperatures (450 to 600℃ for up to 6 hours. It was found that the ultrafine grained structure is thermally stable at the temperatures below 450℃. The deformed microstructure follows a normal grain growth at the higher temperatures having no evidence of abnormal growth. The annealing behavior was characterized by calculating the grain growth activation energy (Q) and the time exponent (n). The value of Q (～180 kJ/mole) was found to be close to the self diffusion activation energy of titanium (169. 1 kJ/mole).
Ultra fined grain (UFG), titanium (Ti) grain growth kinetics electron backscattered diffraction (EBSD)
Majid Hoseini Florent Bridier Philippe Bocher Hojatollah Vali Jerzy A. Szpunar
(E)cole de technologie supérieure,Montréal,QC,Canada H3C 1K3 McGill Institute for Advanced Materials,McGill University,Montreal,QC,Canada H3A 2B2 Department of Mechanical Engineering,University of Saskatchewan,Saskatoon,SK,Canada S7N 5A9
国际会议
The 12th World Conference Titanium(第十二届世界钛会 Ti-2011)
北京
英文
666-670
2011-06-19（万方平台首次上网日期，不代表论文的发表时间）