SHUNT CURRENT LOSS IN THE VANADIUM REDOX FLOW BATTERY SYSTEM
The shunt current will affect the performance of vanadium redox flow battery (VRFB), which exists not only in cell stack, but also in VRFB system. The shunt current loss of cell stack has been reported in the literature by F. Xing. In this paper, a scale-up study of a single cell stack to VRFB system based on the shunt current circuit analog method is proposed. The SOC (state of charge) of electrolyte is introduced to calculate the shunt current loss of the VRFB system. The sensitive analysis of shunt current is reported. The shunt current loss in charge/discharge cycle is predicted with the given experimental data. The effects of charge/discharge patterns on the shunt current loss are studied. The further development of decreasing the shunt current loss of the VRFB system is discussed, which will be helpful for the design and application of large scale VRFB.
Shunt current loss vanadium redox flow battery system circuit analog method
Feng Xing Huamin Zhang Xiangkun Ma
Division of Advanced Energy Storage Batteries and Technologies Dalian Institute of Chemical Physics, Chinese Academy of Sciences Authors addresses: 457 Zhongshan Road, Dalian 116023, P.R. China
国际会议
大连
英文
71
2012-05-28（万方平台首次上网日期，不代表论文的发表时间）