Novel Failure Isolation Techniques for Circuits Sensitive to Microprobe

摘要：

Voltage measurement of test pad directly by microprobe is typical technique in circuit isolation stage of failure analysis. But in some special circuits which are sensitive to microprobe, the voltage of some test pads will change when microprobe needle touches the test pads. Hence it is necessary to develop new measurement skills to confirm test pad status instead of measuring voltage directly. This paper introduces several novel measurement methods to solve this issue and demonstrates these skills with real cases.

关键词： Failure analysis microprobe sensitive circuit

作者: DiWei Fan Miao Wu Joe Yu Winter Wang ChunLei Wu JingLong Li Li Tian

作者单位: Freescale Semiconductor (China) Limited, No.15, Xinghua Avenue, Xiqing Economic Development area, Tianjin,China

会议类型: 国际会议

会议名称: 2012 International Conference on Intelligent System Design and Engineering Applications(2012年智能系统设计与工程应用国际会议 ISDEA 2012)

会议地点: 三亚

会议语种:英文

页码: 401-404

在线出版日期: 2012-01-06（万方平台首次上网日期，不代表论文的发表时间）