Silicon-on-Insulator Based Miniature Integrated Spectrometer Using Echelle Diffraction Grating

摘要：

The design of an on-chip spectrometer based on a silicon-on-insulator planar echelle diffraction grating (EDG) is presented. It has 129 channels, 0.25 nm channel spacing, and 0.1 nm FWHM bandwidth. The spectral range is 1534 nm~1566 nm. The size of the chip is about 0.7 cm×1 cm.

关键词： spectrometer-on-a-chip echelle diffraction grating (EDG) silicon-on-insulator (SOI)

作者: Li Qin Lei Wang Ming-Yu Li Jian-Jun He

作者单位: Center for Integrated Optoelectronics, State Key Laboratory of Modern Optical Instrumentation, Zhejiang University, Hangzhou, PR China, 310027

会议类型: 国际会议

会议名称: 2011亚洲光纤通信与光电国际会议

会议地点: 上海

会议语种:英文

页码: 1-3

在线出版日期: 2011-11-13（万方平台首次上网日期，不代表论文的发表时间）