Solution Triple-Gate TFT LCD Product Flicker Issue after Reliability Testing

摘要：

The flicker issue of triple-gate TFT LCD product after reliability testing has been investigated in this paper. The measurement shows that the optimal voltage of common electrode (Vcom) of the issue panel has changed by checking the sub-pixel pattern shift a column. Considering the different materials were used in the data fanout line, we measured the resistance of fanout lines. The result indicates that a large degree of different resistance of the adjacent fanout lines will lead the flicker issue.

关键词： triple-gate flicker issue fanout line resistance

作者: Song Fang Huilong Zheng Chia-Te Liao Te-Chen Chung Tean-Sen Jen

作者单位: LCD Research and Development center, Info Vision Optoelectronics (Kunshan) Co, Ltd, Jiangsu, China Institute of Jiangsu (IVO) Flat-Panel-Display Technologies, Jiangsu, China

会议类型: 国际会议

会议名称: China Display/Asia Display 2011(2011年中国显示/亚洲显示会议)

会议地点: 江苏昆山

会议语种:英文

页码: 360-361

在线出版日期: 2011-11-07（万方平台首次上网日期，不代表论文的发表时间）