Towards the Next Generation of Low-Power Test Technologies

摘要：

This paper first describes the basics of VLSI testing and the impact of test power. It then reviews the current status of low-power testing. It further highlights the needs for the next generation of lowpower test technologies, which are critical for lowpower devices in the deep submicron era.

作者: Xiaoqing Wen

作者单位: Department of Computer Systems and Engineering Kyushu Institute of Technology Iizuka, 820-8502, Japan

会议类型: 国际会议

会议名称: 2011 IEEE 9th International Conference on ASIC(2011年第九届IEEE国际专用集成电路大会)

会议地点: 厦门

会议语种:英文

页码: 260-263

在线出版日期: 2011-10-25（万方平台首次上网日期，不代表论文的发表时间）