Numerical Characterization of Multi-Dielectric Greens Function for Floating Random Walk Based Capacitance Extraction
The floating random walk (FRW) algorithm has several advantages for extracting interconnect capacitance. However, for multi-layer dielectrics in VLSI technology, the efficiency of FRW algorithm would be degraded due to the frequent stop of walk at dielectric interface. In this paper, an approach is proposed to calculate multi-dielectric Greens function, which is utilized to enable hops across dielectric interface in the FRW. Numerical results show that the proposed approach is about 4X faster than an existing method, and brings several times speedup to the FRW-based capacitance extraction for actual multi-dielectric interconnect structures.
Hao Zhuang Wenjian Yu Gang Hu Zuochang Ye
Department of Computer Science and Technology, Tsinghua University, Beijing 100084, China School of Department of Computer Science and Technology, Tsinghua University, Beijing 100084, China Institute of Microelectronics, Tsinghua University, Beijing 100084, China
国际会议
2011 IEEE 9th International Conference on ASIC(2011年第九届IEEE国际专用集成电路大会)
厦门
英文
361-364
2011-10-25（万方平台首次上网日期，不代表论文的发表时间）