An Efficient Solver for Statistical Capacitance Extraction Considering Random Process Variations
This paper presents an efficient solver for statistical capacitance extraction considering random process variations, which is written in C and named PSCap. The improved continuous surface variation (ICSV) model 1 is applied to accurately describe the variational geometry of VLSI interconnects. Meanwhile, the weighted PFA, HPC 5, and parallel computing techniques are employed to improve its efficiency. Numerical results show that for the typical 65nm-technology structures, PSCap is 30-40％ faster than the statistical capacitance extraction program statcap 1, which was developed in MATLAB, on an 8-core machine. Another contribution of PSCap is that it is able to handle multilayer structures, which statcap fails to handle, producing accurate results with less than 5％ error.
Rubing Bai Shan Zeng Qingqing Zhang Wenjian Yu
Department of Computer Science and Technology, Tsinghua University, Beijing 100084, China School of Software, China University of Geosciences, Beijing 100083, China Department of Computer Science and Technology, Tsinghua University, Beijing 100084, China College of
国际会议
2011 IEEE 9th International Conference on ASIC(2011年第九届IEEE国际专用集成电路大会)
厦门
英文
602-605
2011-10-25（万方平台首次上网日期，不代表论文的发表时间）