The Design and Verification of SEU-hardened Configurable DFF

摘要：

This paper presents a circuit-level radiation hardened structure with the function of anti-SBU, anti-MBU and anti-SET. At the same time, the paper proposes a fast and accurate method to simulate SEU effects by using TCAD and Cadence. Whats more, a comparison between the proposed structure and structures in literatures proves the proposed ones superiority in the circuit performance, area, power consumption and other aspects with the usage of the proposed testing method. Moreover, the proposed structure is applied to the configurable DFF in FPGA to certificate its practicality and portability. While keeping the primary advantages such as wellperformed and configurable ability, the hardened DFF has a strong anti-radiation performance with a LET threshold of more than 100MeVcm2/mg , which is identified to be immune to SEU.

关键词： SBU MBU SET circuit-level harden configurable DFF

作者: Xinrui Zhang Liguang Chen Liyun Wang Jian Wang Jinmei Lai

作者单位: State Key Laboratory of ASIC and System, Fudan University, Shanghai 201203, China

会议类型: 国际会议

会议名称: 2011 IEEE 9th International Conference on ASIC(2011年第九届IEEE国际专用集成电路大会)

会议地点: 厦门

会议语种:英文

页码: 1008-1011

在线出版日期: 2011-10-25（万方平台首次上网日期，不代表论文的发表时间）