The Application of Line-labeling Algorithm to on-line defect detection system for printed-matter

摘要：

The Application of Line-labeling algorithm to on-line defect detection system for printed-matter was studied in this paper and it was compared with Pixel Labeled Algorithm. The algorithm is based on the line between rows. Connected regions of defect were marked and their parameters (position, area,etc) were obtained rapidly by scan the full image only once, while the full image has to be scanned twice and an equivalent mark table has to be produced in Pixel Labeled Algorithm. Practical application shows that Line-labeling algorithm is more suitable for on-line defect detection system.

关键词： component Line-labeling algorithm Pixel Labeled Algorithm on-line defect detection system

作者: Min Xu Wanyou Tang

作者单位: School of Packing and Printing Egineering TianJin university of science and technology TianJin, china

会议类型: 国际会议

会议名称: 2011 4th International Congress on Image and Signal Processing(第四届图像与信号处理国际学术会议 CISP 2011)

会议地点: 上海

会议语种:英文

页码: 320-323

在线出版日期: 2011-10-15（万方平台首次上网日期，不代表论文的发表时间）