Quality Analysis of Wheat Based on BP Neural Network and Near Infrared Reflectance Spectroscopy

摘要：

With its quick, simple, nicety and nondestructive characteristic, MRS (Near Infrared Reflectance Spectroscopy) is a new method for quality analysis of wheat. In this paper, a new method to model-building for wheat quality analysis with NIRS is presented. Opposite near infrared parameters shield the testing accuracy from outer disturb and random factors. Local minimization is escaped, and a high convergence velocity is reached by modified BP algorithm. The experimental results indicate that a high-accuracy testing results can be get in spite of large disturb from temperature and moisture.

关键词： wheat near infrared reflectance spectroscopy neural network quality analysis

作者: Liu Hexiao Liu Mingliang Sun Laijun Qian Haibo Li Wenbo Wang Lekai Dai Changjun

作者单位: Key Laboratory of Electronics Engineering, College of Heilongjiang Province Heilongjiang University Inspection and Testing Center for Quality of cereals and Their Products, Ministry of Agriculture Hei

会议类型: 国际会议

会议名称: 2011 International Conference on Agricultural Engineering New Technology & Taishan Academic Forum(2011农业工程新技术国际学术会议暨泰山学术论坛 ICAE2011&TSAF)

会议地点: 山东淄博

会议语种:英文

页码: 775-778

在线出版日期: 2011-05-27（万方平台首次上网日期，不代表论文的发表时间）